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图片 型号 厂商 标准 分类 描述
Image: MIT420-EN MIT420-EN Megger 测试和测量 绝缘测试器/兆欧计 insulation testers / megohmmeters advanced cat4 600v with result storage
Image: AVR1300 AVR1300 Atmel Up to 12 bit resolution signed and unsigned mode result comparator
Image: NTC0603-KIT NTC0603-KIT TDK 附件 热敏电阻套件 tdk thermistors have low thermal time constants which result in extremely high rates of resistance change to accurately track the temperature.
Image: UTXFF4R UTXFF4R Amphenol Industrial 连接器 太阳能连接器/电伏连接 the total volume and characteristics of the materials used to make the utx™ have been optimized to result in a more efficient and robust design.
Image: C0603X822F5JACTU C0603X822F5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X103F5JACTU C0603X103F5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X103J8JACTU C0603X103J8JACTU Kemet 无源元器件 电容器 the addition of this epoxy layer inhibits the transfer of board stress to the rigid ceramic body, therefore mitigating flex cracks which can result in low IR or short circuit failures.
Image: C0603X822J5JACTU C0603X822J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X912J5JACTU C0603X912J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X182J5JACTU C0603X182J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X752J5JACTU C0603X752J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X392J5JACTU C0603X392J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X432J5JACTU C0603X432J5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: C0603X752G5JACTU C0603X752G5JACTU Kemet 无源元器件 电容器 kemet’s high voltage with flexible termination (HV FT-cap) surface mount mlccs in x7r dielectric address the primary failure mode of mlccs– flex cracks, which are typically the result of excessive tensile and shear stresses produced during board flexure and thermal cycling.
Image: GET-30569 GET-30569 California Eastern Labs qualification test results on ne272 ser es
Image: GET-30497 GET-30497 California Eastern Labs qualification test results on Si mmic
Image: GET-30704 GET-30704 California Eastern Labs qualification test results on Si mmic
Image: GET-BC-0006 GET-BC-0006 California Eastern Labs qualification test results on Si mmic
Image: NCL30001 NCL30001 ON Semiconductor 嵌入式解决方案 评估板 -  LED 驱动器 the ncl30001 is a highly integrated controller for implementing power factor correction (pfc) and isolated step down ac−dc power conversion in a single stage, resulting in a lower cost and reduced part count solution.
Image: Accu-P Accu-P AVX Corporation 无源元器件 薄膜电容器 the use of silicon oxide, a very low - loss dielectric material, in conjunction with highly conductive electrode metals, results in low esr and high Q.

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