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IDT71V546S117PF |
Integrated Device Technology |
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128k x 36, 3.3V synchronous sram with zbt feature, burst counter and pipelined outputs |
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IDT71V546S117PFI |
Integrated Device Technology |
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128k x 36, 3.3V synchronous sram with zbt feature, burst counter and pipelined outputs |
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IDT71V546S133PF |
Integrated Device Technology |
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128k x 36, 3.3V synchronous sram with zbt feature, burst counter and pipelined outputs |
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IDT71V546S133PFI |
Integrated Device Technology |
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128k x 36, 3.3V synchronous sram with zbt feature, burst counter and pipelined outputs |
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STG3699 |
STMicroelectronics |
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集成电路
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low voltage 0.5з max quad spdt switch with break before make feature |
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STG3699TTR |
STMicroelectronics |
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low voltage 0.5з max quad spdt switch with break before make feature |
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AK4114 |
Asahi Kasei Microsystems |
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high feature 192khz 24bit digital audio interface transceiver |
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AK4114VQ |
Asahi Kasei Microsystems |
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high feature 192khz 24bit digital audio interface transceiver |
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U4090B |
TEMIC Semiconductors |
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monolithic integrated feature phone circuit |
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U4090B |
Atmel |
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集成电路
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monolithic integrated feature phone circuit |
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U4090B-FN |
Atmel |
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monolithic integrated feature phone circuit |
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U4090B-FN |
TEMIC Semiconductors |
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monolithic integrated feature phone circuit |
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AK4110 |
Asahi Kasei Microsystems |
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high feature 96khz 24bit dir |
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AK4112A |
Asahi Kasei Microsystems |
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high feature 96khz 24bit dir |
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AK4112AVF |
Asahi Kasei Microsystems |
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high feature 96khz 24bit dir |
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AS3502 |
austriamicrosystems AG |
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13-bit linear feature codec with analogue frontend |
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HI-200/883 |
Intersil Corporation |
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the HI-200/883 is a monolithic device comprising two independently selectable spst switchers which feature fast switching speeds |
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STB40NE03L-20 |
STMicroelectronics |
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N - channel enhancement mode ” single feature size ” power mosfet |
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LUCL9310AP-D |
Agere Systems |
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line interface and line access circuit full-feature slic,ringing relay,and test access device |
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LUCL9310AP-DT |
Agere Systems |
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line interface and line access circuit full-feature slic,ringing relay,and test access device |